On the in-field functional testing of decode units in pipelined RISC processors. - Paolo Bernardi; Riccardo Cantoro; Lyl M. Ciganda Brasca; Ernesto Sánchez 001; Matteo Sonza Reorda; Sergio de Luca; Renato Meregalli; Alessandro Sansonetti (DFT, 2014)

Software-based self-test techniques of computational modules in dual issue embedded processors. - Paolo Bernardi; C. Bovi; Riccardo Cantoro; Sergio de Luca; Renato Meregalli; Davide Piumatti; Ernesto Sánchez 001; Alessandro Sansonetti (ETS, 2015)

In-field functional test programs development flow for embedded FPUs. - Riccardo Cantoro; Davide Piumatti; Paolo Bernardi; Sergio de Luca; Alessandro Sansonetti (DFT, 2016)

Development Flow for On-Line Core Self-Test of Automotive Microcontrollers. - Paolo Bernardi; Riccardo Cantoro; Sergio de Luca; Ernesto Sánchez 001; Alessandro Sansonetti (IEEE Trans. Computers, 2016)

On-line software-based self-test for ECC of embedded RAM memories. - Marco Restifo; Paolo Bernardi; Sergio de Luca; Alessandro Sansonetti (DFT, 2017)

Robustness in automotive electronics: An industrial overview of major concerns. - Ulrich Backhausen; Oscar Ballan; Paolo Bernardi; Sergio de Luca; Julie Henzler; Thomas Kern; Davide Piumatti; Thomas Rabenalt; Krishnapriya Chakiat Ramamoorthy; Ernesto Sánchez 001; Alessandro Sansonetti; Rudolf Ullmann; et al. (IOLTS, 2017)

On the in-field testing of spare modules in automotive microprocessors. - Paolo Bernardi; Sergio de Luca; Davide Piumatti; S. Regis; Ernesto Sánchez 001; Alessandro Sansonetti (VLSI-SoC, 2017)

Parallel software-based self-test suite for multi-core system-on-chip: Migration from single-core to multi-core automotive microcontrollers. - Andrea Floridia; Davide Piumatti; Ernesto Sánchez 001; Sergio de Luca; Alessandro Sansonetti (DTIS, 2018)

Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions. - Paolo Bernardi; Riccardo Cantoro; Andrea Floridia; Davide Piumatti; C. Pogonea; Annachiara Ruospo; Ernesto Sánchez 001; Sergio de Luca; Alessandro Sansonetti (DATE, 2019)

Software-Based Self-Test Techniques for Dual-Issue Embedded Processors. - Paolo Bernardi; Riccardo Cantoro; Sergio de Luca; Ernesto Sánchez 001; Alessandro Sansonetti; Giovanni Squillero (IEEE Trans. Emerg. Top. Comput., 2020)