Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress. - Simone Gerardin; Alessio Griffoni; Andrea Cester; Alessandro Paccagnella; G. Ghidini (Microelectron. Reliab., 2006)

ESD and ionizing radiation effects on ultrathin body SOI and multiple gate technologies. - Alessio Griffoni (2009)

ESD characterization of multi-chip RGB LEDs. - Simone Vaccari; Matteo Meneghini; Alessio Griffoni; Diego Barbisan; Marco Barbato; S. Carraro; Marco La Grassa; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2013)

ESD degradation and robustness of RGB LEDs and modules: An investigation based on combined electrical and optical measurements. - Matteo Meneghini; Simone Vaccari; Matteo Dal Lago; Stefano Marconi; Marco Barbato; Nicola Trivellin; Alessio Griffoni; Alberto Alfier; Giovanni Verzellesi; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2014)