Degradation Monitoring - from a Vision to Reality. - Evelyn Landman; Shai Cohen; Noam Brousard; Raanan Gewirtzman; Inbar Weintrob; Eyal Fayne; Yahel David; Yuval Bonen; Omer Niv; Shai Tzroia; Alex Burlak; J. W. McPherson (IRPS, 2019)

Applying Universal Chip Telemetry to Detect Latent Defects and Aging in Advanced Electronics. - Evelyn Landman; Alex Burlak; C. Nir Sever; Marc Hutner (IRPS, 2022)