Positive-bias temperature instability (PBTI) of GaN MOSFETs. - Alex Guo; Jesús A. del Alamo (IRPS, 2015)

Bias temperature instability (BTI) in GaN MOSFETs. - Alex Guo (2016)

Blending data and physics for reduced-order modeling of systems with spatiotemporal chaotic dynamics. - Alex Guo; Michael D. Graham (CoRR, 2025)