Predicting Vt mean and variance from parallel Id measurement with model-fitting technique. - Chih-Ying Tsai; Kao-Chi Lee; Chien-Hsueh Lin; Sung-Chu Yu; Wen-Rong Liau; Alex Chun-Liang Hou; Ying-Yen Chen; Chun-Yi Kuo; Jih-Nung Lee; Mango C.-T. Chao (VTS, 2016)

Predicting Shot-Level SRAM Read/Write Margin Based on Measured Transistor Characteristics. - Shu-Yung Bin; Shih-Feng Lin; Ya Ching Cheng; Wen-Rong Liau; Alex Hou; Mango C.-T. Chao (IEEE Trans. Very Large Scale Integr. Syst., 2016)

A Model-Based-Random-Forest Framework for Predicting Vt Mean and Variance Based on Parallel Id Measurement. - Chien-Hsueh Lin; Chih-Ying Tsai; Kao-Chi Lee; Sung-Chu Yu; Wen-Rong Liau; Alex Chun-Liang Hou; Ying-Yen Chen; Chun-Yi Kuo; Jih-Nung Lee; Mango C.-T. Chao (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018)