Using Boundary Scan Test to Test Random Access Memory Clusters. - Math Muris; Alex S. Biewenga (ITC, 1993)

Testing a multichip package for a consumer communications application. - Alex S. Biewenga; Math Muris; Rodger Schuttert; Urs Fawer (ITC, 1998)

Static component interconnect test technology (SCITT) a new technology for assembly testing. - Alex S. Biewenga; Henk D. L. Hollmann; Frans G. M. de Jong; Maurice Lousberg (ITC, 1999)

Testing and programming flash memories on assemblies during high volume production. - Frans G. M. de Jong; Alex S. Biewenga; D. C. L. (Erik) van Geest; T. F. Waayers (ITC, 2001)

SiP-TAP: JTAG for SiP. - Frans G. M. de Jong; Alex S. Biewenga (ITC, 2006)

SiP-test: Predicting delivery quality. - Alex S. Biewenga; Frans G. M. de Jong (ITC, 2007)