Multiple Deep Learning Architectures Achieve Superior Performance Diagnosing Autism Spectrum Disorder Using Features Previously Extracted From Structural And Functional Mri. - Cooper Mellema; Alex Treacher; Kevin P. Nguyen; Albert Montillo (ISBI, 2019)

Deep learning convolutional neural networks for the estimation of liver fibrosis severity from ultrasound texture. - Alex Treacher; Daniel Beauchamp; Bilal Quadri; David Fetzer; Abhinav Vij; Takeshi Yokoo; Albert Montillo (Computer-Aided Diagnosis, 2019)

Predicting Response to the Antidepressant Bupropion Using Pretreatment fMRI. - Kevin P. Nguyen; Cherise Chin Fatt; Alex Treacher; Cooper Mellema; Madhukar H. Trivedi; Albert Montillo (PRIME@MICCAI, 2019)

Architectural configurations, atlas granularity and functional connectivity with diagnostic value in Autism Spectrum Disorder. - Cooper J. Mellema; Alex Treacher; Kevin P. Nguyen; Albert Montillo (ISBI, 2020)

Anatomically informed data augmentation for functional MRI with applications to deep learning. - Kevin P. Nguyen; Cherise Chin Fatt; Alex Treacher; Cooper Mellema; Madhukar H. Trivedi; Albert Montillo (Image Processing, 2020)

MEGnet: Automatic ICA-based artifact removal for MEG using spatiotemporal convolutional neural networks. - Alex Treacher; Prabhat Garg; Elizabeth M. Davenport; Ryan Godwin; Amy L. Proskovec; Leonardo Guimaraes Bezerra; Gowtham Murugesan; Benjamin C. Wagner; Christopher T. Whitlow; Joel D. Stitzel; Joseph A. Maldjian; Albert Montillo (NeuroImage, 2021)

DC and SA: Robust and Efficient Hyperparameter Optimization of Multi-subnetwork Deep Learning Models. - Alex H. Treacher; Albert Montillo (CoRR, 2022)

UQ-ARMED: Uncertainty quantification of adversarially-regularized mixed effects deep learning for clustered non-iid data. - Alex Treacher; Kevin P. Nguyen; Dylan Owens; Daniel Heitjan; Albert Montillo (CoRR, 2022)

Adversarially-Regularized Mixed Effects Deep Learning (ARMED) Models Improve Interpretability, Performance, and Generalization on Clustered (non-iid) Data. - Kevin P. Nguyen; Alex H. Treacher; Albert Montillo (IEEE Trans. Pattern Anal. Mach. Intell., 2023)