Monte Carlo simulation of silicon amorphization during ion implantation. - Walter Bohmayr; Alexander Burenkov; Jürgen Lorenz; Heiner Ryssel; Siegfried Selberherr (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1998)

Characterization of n-channel MOSFETs: Electrical measurements and simulation analysis. - Viktoryia Uhnevionak; Christian Strenger; Alexander Burenkov; V. Mortet; Elena Bedel-Pereira; Jürgen Lorenz; Peter Pichler (ESSDERC, 2013)