Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs. - Alexander Makarov; Ben Kaczer; Philippe Roussel; Adrian Vaisman Chasin; Alexander Grill; Michiel Vandemaele; Geert Hellings; Al-Moatasem El-Sayed; Tibor Grasser; Dimitri Linten; Stanislav Tyaginov (IRPS, 2019)

Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures. - Alexander Grill; Erik Bury; Jakob Michl; Stanislav Tyaginov; Dimitri Linten; Tibor Grasser; Bertrand Parvais; Ben Kaczer; Michael Waltl; Iuliana P. Radu (IRPS, 2020)

On the impact of mechanical stress on gate oxide trapping. - Anastasiia Kruv; Ben Kaczer; Alexander Grill; Mario Gonzalez; Jacopo Franco; Dimitri Linten; Wolfgang Goes; Tibor Grasser; Ingrid De Wolf (IRPS, 2020)

Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures. - Jakob Michl; Alexander Grill; Dieter Claes; Gerhard Rzepa; Ben Kaczer; Dimitri Linten; Iuliana P. Radu; Tibor Grasser; Michael Waltl (IRPS, 2020)

A Compact Physics Analytical Model for Hot-Carrier Degradation. - Stanislav Tyaginov; Alexander Grill; Michiel Vandemaele; Tibor Grasser; Geert Hellings; Alexander Makarov; Markus Jech; Dimitri Linten; Ben Kaczer (IRPS, 2020)

Solid state qubits: how learning from CMOS fabrication can speed-up progress in Quantum Computing. - Iuliana P. Radu; Roy Li; Anton Potocnik; Tsvetan Ivanov; Danny Wan; Stefan Kubicek; Nard I. Dumoulin Stuyck; Jeroen Verjauw; Julien Jussot; Yann Canvel; Clement Godfrin; Massimo Mongillo; et al. (VLSI Circuits, 2021)

Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors. - Alexander Grill; V. John; Jakob Michl; A. Beckers; Erik Bury; Stanislav Tyaginov; Bertrand Parvais; Adrian Vaisman Chasin; Tibor Grasser; Michael Waltl; Ben Kaczer; Bogdan Govoreanu (IRPS, 2022)

Significant Enhancement of HCD and TDDB in CMOS FETs by Mechanical Stress. - Kookjin Lee; Ben Kaczer; Anastasiia Kruv; Mario Gonzalez; Geert Eneman; Oguzhan O. Okudur; Alexander Grill; Jacopo Franco; Andrea Vici; Robin Degraeve; Ingrid De Wolf (IRPS, 2022)

Modelling ultra-fast threshold voltage instabilities in Hf-based ferroelectrics. - Barry J. O'Sullivan; Brecht Truijen; Vamsi Putcha; Alexander Grill; Adrian Vaisman Chasin; Geert Van den Bosch; Ben Kaczer; Md Nur K. Alam; Jan Van Houdt (IRPS, 2022)

On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors. - Stanislav Tyaginov; Aryan Afzalian; Alexander Makarov; Alexander Grill; Michiel Vandemaele; Maksim Cherenev; Mikhail I. Vexler; Geert Hellings; Ben Kaczer (IRPS, 2022)

Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors. - Stanislav Tyaginov; Alexander Makarov; Al-Moatasem Bellah El-Sayed; Adrian Vaisman Chasin; Erik Bury; Markus Jech; Michiel Vandemaele; Alexander Grill; An De Keersgieter; Mikhail I. Vexler; Geert Eneman; Ben Kaczer (IRPS, 2022)

Scalable 1.4 μW cryo-CMOS SP4T multiplexer operating at 10 mK for high-fidelity superconducting qubit measurements. - Rohith Acharya; Anton Potocnik; Steven Brebels; Alexander Grill; Jeroen Verjauw; Tsvetan Ivanov; Daniel Perez Lozano; Danny Wan; Fahd A. Mohiyaddin; Jacques Van Damme; A. M. Vadiraj; Massimo Mongillo; et al. (VLSI Technology and Circuits, 2022)

Study of Transistor Metrics for Room-Temperature Screening of Single Electron Transistors for Silicon Spin Qubit Applications. - Francesco Lorenzelli; Asser Elsayed; Clement Godfrin; Alexander Grill; Stefan Kubicek; Ruoyu Li; Michele Stucchi; Danny Wan; Kristiaan De Greve; Erik Jan Marinissen; Georges G. E. Gielen (ETS, 2023)

Wafer-Scale Electrical Characterization of Silicon Quantum Dots from Room to Low Temperatures. - Francesco Lorenzelli; Asser Elsayed; Clement Godfrin; Alexander Grill; Stefan Kubicek; Ruoyu Li; Michele Stucchi; Danny Wan; Kristiaan De Greve; Erik Jan Marinissen; Georges G. E. Gielen (ITC, 2023)

Insight into Latchup Risk in 28nm Planar Bulk Technology for Quantum Computing Applications. - Kateryna Serbulova; Zi-En Qiu; Shih-Hung Chen; Alexander Grill; Kuo-Hsing Kao; Jo De Boeck; Guido Groeseneken (IRPS, 2024)

Impact of Gate Metal Work Function on 1/f Noise in RMG MOSFETs. - R. Asanovski; Hiroaki Arimura; J. Ganguly; Pierpaolo Palestri; Alexander Grill; Ben Kaczer; Naoto Horiguchi; Luca Selmi; Jacopo Franco (IRPS, 2025)

Investigation of Cryogenic Aging in 28 nm CMOS: Suppression of BTI and HCD in Circuits and SRAM. - Javier Diaz-Fortuny; Mahdi Benkhelifa; Alexander Grill; Erik Bury; Robin Degraeve; Ben Kaczer; Hussam Amrouch (IRPS, 2025)

Advanced RTN Analysis on 3D NAND Trench Devices Using Physics-Informed Machine Learning Framework. - Yusuke Higashi; Anirudh Varanasi; Philippe J. Roussel; Pablo Saraza-Canflanca; J. P. Bastos; Alexander Grill; E. Catapano; R. Asanovski; Jacopo Franco; Ben Kaczer; Adrian Chasin; Devin Verreck; et al. (IRPS, 2025)

CV Characterization of Si/SiGe Heterostructures at Cryo Temperatures. - F. Stampfl; Clement Godfrin; Stefan Kubicek; S. Baudot; B. Raes; Kristiaan De Greve; Alexander Grill; M. Waltl (IRPS, 2025)