Modeling of the SET and RESET Process in Bipolar Resistive Oxide-Based Memory Using Monte Carlo Simulations. - Alexander Makarov; Viktor Sverdlov; Siegfried Selberherr (NMA, 2010)

Efficient Simulations of the Transport Properties of Spin Field-Effect Transistors Built on Silicon Fins. - Dmitry Osintsev; Alexander Makarov; Viktor Sverdlov; Siegfried Selberherr (LSSC, 2011)

Emerging memory technologies: Trends, challenges, and modeling methods. - Alexander Makarov; Viktor Sverdlov; Siegfried Selberherr (Microelectron. Reliab., 2012)

Magnetic tunnel junctions for future memory and logic-in-memory applications. - Viktor Sverdlov; Hiwa Mahmoudi; Alexander Makarov; Siegfried Selberherr (MIXDES, 2014)

SOT-MRAM based on 1Transistor-1MTJ-cell structure. - Alexander Makarov; Thomas Windbacher; Viktor Sverdlov; Siegfried Selberherr (NVMTS, 2015)

A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer nMOSFETs. - Prateek Sharma; Stanislav Tyaginov; Stewart E. Rauch; Jacopo Franco; Ben Kaczer; Alexander Makarov; Mikhail I. Vexler; Tibor Grasser (ESSDERC, 2016)

The exploitation of magnetization orientation encoded spin-transfer torque for an ultra dense non-volatile magnetic shift register. - Thomas Windbacher; Alexander Makarov; Viktor Sverdlov; Siegfried Selberherr (ESSDERC, 2016)

Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering the Impact of Random Traps and Random Dopants. - Alexander Makarov; Dimitri Linten; Stanislav Tyaginov; Ben Kaczer; Philippe Roussel; Adrian Vaisman Chasin; Michiel Vandemaele; Geert Hellings; Al-Moatasem El-Sayed; Markus Jech; Tibor Grasser (ESSDERC, 2019)

Switching Speedup of the Magnetic Free Layer of Advanced SOT-MRAM. - Roberto Lacerda de Orio; Alexander Makarov; Siegfried Selberherr; Wolfgang Goes; Johannes Ender; Simone Fiorentini; Viktor Sverdlov (ESSDERC, 2019)

Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs. - Alexander Makarov; Ben Kaczer; Philippe Roussel; Adrian Vaisman Chasin; Alexander Grill; Michiel Vandemaele; Geert Hellings; Al-Moatasem El-Sayed; Tibor Grasser; Dimitri Linten; Stanislav Tyaginov (IRPS, 2019)

Full (Vg, Vd) Bias Space Modeling of Hot-Carrier Degradation in Nanowire FETs. - Michiel Vandemaele; Ben Kaczer; Stanislav Tyaginov; Zlatan Stanojevic; Alexander Makarov; Adrian Vaisman Chasin; Erik Bury; Hans Mertens; Dimitri Linten; Guido Groeseneken (IRPS, 2019)

A Compact Physics Analytical Model for Hot-Carrier Degradation. - Stanislav Tyaginov; Alexander Grill; Michiel Vandemaele; Tibor Grasser; Geert Hellings; Alexander Makarov; Markus Jech; Dimitri Linten; Ben Kaczer (IRPS, 2020)

Style transfer with variational autoencoders is a promising approach to RNA-Seq data harmonization and analysis. - Nikolay Russkikh; Denis V. Antonets; Dmitry Shtokalo; Alexander Makarov; Yuri Vyatkin; Alexey Zakharov; Evgeny Terentyev (Bioinform., 2020)

On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors. - Stanislav Tyaginov; Aryan Afzalian; Alexander Makarov; Alexander Grill; Michiel Vandemaele; Maksim Cherenev; Mikhail I. Vexler; Geert Hellings; Ben Kaczer (IRPS, 2022)

Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors. - Stanislav Tyaginov; Alexander Makarov; Al-Moatasem Bellah El-Sayed; Adrian Vaisman Chasin; Erik Bury; Markus Jech; Michiel Vandemaele; Alexander Grill; An De Keersgieter; Mikhail I. Vexler; Geert Eneman; Ben Kaczer (IRPS, 2022)

Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs. - Michiel Vandemaele; Ben Kaczer; Stanislav Tyaginov; Erik Bury; Adrian Vaisman Chasin; Jacopo Franco; Alexander Makarov; Hans Mertens; Geert Hellings; Guido Groeseneken (IRPS, 2022)

Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations: Invited Paper. - Michiel Vandemaele; Ben Kaczer; Erik Bury; Jacopo Franco; Adrian Chasin; Alexander Makarov; Hans Mertens; Geert Hellings; Guido Groeseneken (IRPS, 2023)