Scanning probe microscopy in semiconductor failure analysis. - Bernd Ebersberger; Alexander Olbrich; Christian Boit (Microelectron. Reliab., 2001)

Application of Scanning Probe Microscopy techniques in Semiconductor Failure Analysis. - Bernd Ebersberger; Alexander Olbrich; Christian Boit (Microelectron. Reliab., 2001)

Local current fluctuations before and after breakdown of thin SiO2 films observed with conductive atomic force microscope. - Marc Porti; X. Blasco; Montserrat Nafría; Xavier Aymerich; Alexander Olbrich; Bernd Ebersberger (Microelectron. Reliab., 2001)

Modeling and Reconstruction of State Variables for Low-Level Control of Soft Pneumatic Actuators. - Serhat Ibrahim; Jan Christoph Krause; Alexander Olbrich; Annika Raatz (Frontiers Robotics AI, 2021)