Towards automatic diagnosis of minority carriers propagation problems in HV/HT automotive smart power ICs. - Yasser Moursy; Hao Zou 002; Ramy Iskander; Pierre Tisserand; Dieu-My Ton; Giuseppe Pasetti; Ehrenfried Seebacher; Alexander Steinmair; Thomas Gneiting; Heidrun Alius (DATE, 2016)

Analysis of substrate currents propagation in HVCMOS technology. - Camillo Stefanucci; Pietro Buccella; Ehrenfried Seebacher; Alexander Steinmair; Maher Kayal; Jean-Michel Sallese (ESSDERC, 2016)

Using CAD Tool for Substrate Parasitic Modeling in Smart Power Technology. - Hao Zou 002; Yasser Moursy; Ramy Iskander; Alexander Steinmair; Heimo Gensinger; Ehrenfried Seebacher; Jean-Paul Chaput; Marie-Minerve Louërat (IEEE Trans. Circuits Syst. I Regul. Pap., 2016)

Modeling of dynamic trap density increase for aging simulation of any MOSFET circuits. - Mitiko Miura-Mattausch; Hidenori Miyamoto; Hideyuki Kikuchihara; Dondee Navarro; Tapas K. Maiti; Nezam Rohbani; C. Ma; Hans Jürgen Mattausch; A. Schiffmann; Alexander Steinmair; Ehrenfried Seebacher (ESSDERC, 2017)