Effects of Temperature and Supply Voltage on Soft Errors for 7-nm Bulk FinFET Technology. - Alexandra Feeley; Yoni Xiong; Bharat L. Bhuva; Balaji Narasimham; Shi-Ji Wen; Rita Fung (IRPS, 2021)

Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node. - Yoni Xiong; Alexandra Feeley; Lloyd W. Massengill; Bharat L. Bhuva; Shi-Jie Wen; Rita Fung (IRPS, 2021)

Single-Event Latchup Vulnerability at the 7-nm FinFET Node. - Nicholas J. Pieper; Yoni Xiong; Alexandra Feeley; Dennis R. Ball; Bharat L. Bhuva (IRPS, 2022)

Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment. - Yoni Xiong; Alexandra Feeley; Nicholas J. Pieper; Dennis R. Ball; Balaji Narasimham; John Brockman; N. A. Dodds; S. A. Wender; Shi-Jie Wen; Rita Fung; Bharat L. Bhuva (IRPS, 2022)