Impact of gate workfunction fluctuation on FinFET standard cells. - Cristina Meinhardt; Alexandra L. Zimpeck; Ricardo Augusto da Luz Reis (ICECS, 2014)

Evaluating the impact of environment and physical variability on the ION current of 20nm FinFET devices. - Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo Reis 001 (PATMOS, 2014)

Predictive evaluation of electrical characteristics of sub-22 nm FinFET technologies under device geometry variations. - Cristina Meinhardt; Alexandra L. Zimpeck; Ricardo A. L. Reis (Microelectron. Reliab., 2014)

Process variability in FinFET standard cells with different transistor sizing techniques. - Alexandra L. Zimpeck; Cristina Meinhardt; Gracieli Posser; Ricardo Reis 001 (ICECS, 2015)

Analyzing the Impact of Frequency and Diverse Path Delays in the Time Vulnerability Factor of Master-Slave D Flip-Flops. - Alexandra L. Zimpeck; Fernanda Lima Kastensmidt; Ricardo Reis 001 (ISVLSI, 2015)

Impact of PVT variability on 20 nm FinFET standard cells. - Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo Augusto da Luz Reis (Microelectron. Reliab., 2015)

Geometric variability impact on 7nm Trigate combinational cells. - Alexandra L. Zimpeck; Ygor Aguiar; Cristina Meinhardt; Ricardo Reis 001 (ICECS, 2016)

Impact of variability effects on FinFET transistors and combinational cells. - Alexandra L. Zimpeck; Ricardo Reis 001 (ICECS, 2016)

FinFET cells with different transistor sizing techniques against PVT variations. - Alexandra L. Zimpeck; Cristina Meinhardt; Gracieli Posser; Ricardo Augusto da Luz Reis (ISCAS, 2016)

Permanent and single event transient faults reliability evaluation EDA tool. - Y. Q. de Aguiar; Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo Augusto da Luz Reis (Microelectron. Reliab., 2016)

Temperature dependence and ZTC bias point evaluation of sub 20nm bulk multigate devices. - Ygor Q. Aguiar; Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo A. L. Reis (ICECS, 2017)

Impact of schmitt trigger inverters on process variability robustness of 1-Bit full adders. - Samuel Presa Toledo; Alexandra L. Zimpeck; Ricardo Reis 001; Cristina Meinhardt (ICECS, 2017)

Robustness of Sub-22nm multigate devices against physical variability. - Alexandra L. Zimpeck; Ygor Aguiar; Cristina Meinhardt; Ricardo Reis 001 (ISCAS, 2017)

Exploring Multi-level Design to Mitigate Variability and Radiation Effects on 7nm FinFET Logic Cells. - Leonardo Heitich Brendler; Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo Reis 001 (ICECS, 2018)

Pros and Cons of Schmitt Trigger Inverters to Mitigate PVT Variability on Full Adders. - Samuel Presa Toledo; Alexandra L. Zimpeck; Ricardo Reis 001; Cristina Meinhardt (ISCAS, 2018)

Evaluating the Impact of Process Variability and Radiation Effects on Different Transistor Arrangements. - Leonardo Heitich Brendler; Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo Reis 001 (VLSI-SoC, 2018)

Evaluation of variability using Schmitt trigger on full adders layout. - Leonardo B. Moraes; Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo Augusto da Luz Reis (Microelectron. Reliab., 2018)

Impact of different transistor arrangements on gate variability. - Alexandra L. Zimpeck; Cristina Meinhardt; Laurent Artola; Guillaume Hubert; Fernanda Lima Kastensmidt; Ricardo Augusto da Luz Reis (Microelectron. Reliab., 2018)

Sleep Transistors to Improve the Process Variability and Soft Error Susceptibility. - Alexandra L. Zimpeck; Cristina Meinhardt; Laurent Artola; Guillaume Hubert; Fernanda Lima Kastensmidt; Ricardo Augusto da Luz Reis (ICECS, 2019)

Exploring Schmitt Trigger Circuits for Process Variability Mitigation. - Leonardo B. Moraes; Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo Augusto da Luz Reis (NEWCAS, 2019)

Process Variability Impact on the SET Response of FinFET Multi-level Design. - Leonardo Heitich Brendler; Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo Reis 001 (VLSI-SoC (Selected Papers), 2019)

Evaluation of SET under Process Variability on FinFET Multi-level Design. - Leonardo Heitich Brendler; Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo A. L. Reis (VLSI-SoC, 2019)

Impact of Process Variability and Single Event Transient on FinFET Technology. - Leonardo Heitich Brendler; Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo A. L. Reis (VLSI-SoC, 2019)

Minimum Energy FinFET Schmitt Trigger Design Considering Process Variability. - Leonardo B. Moraes; Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo Augusto da Luz Reis (VLSI-SoC, 2019)

Robustness and Minimum Energy-Oriented FinFET Design. - Leonardo B. Moraes; Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo Augusto da Luz Reis (VLSI-SoC, 2019)

Robust FinFET Schmitt Trigger Designs for Low Power Applications. - Leonardo B. Moraes; Alexandra Lackmann Zimpeck; Cristina Meinhardt; Ricardo A. L. Reis (VLSI-SoC (Selected Papers), 2019)

Circuit-Level Techniques to Mitigate Process Variability and Soft Errors in FinFET Designs. - Alexandra L. Zimpeck; Cristina Meinhardt; Laurent Artola; Guillaume Hubert; Fernanda Lima Kastensmidt; Ricardo Augusto da Luz Reis (VLSI-SoC, 2019)

Pros and Cons of ST and SIG FinFET Inverters for Low Power Designs. - Leonardo B. Moraes; Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo Reis 001 (ISCAS, 2020)

Work-Function Fluctuation Impact on the SET Response of FinFET-based Majority Voters. - Leonardo Heitich Brendler; Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo Augusto da Luz Reis (LATS, 2020)

Circuit Level Design Methods to Mitigate Soft Errors. - Ricardo A. L. Reis; Cristina Meinhardt; Alexandra L. Zimpeck; Leonardo Heitich Brendler; Leonardo B. Moraes (LATS, 2020)

Multi-Level Design Influences on Robustness Evaluation of 7nm FinFET Technology. - Leonardo Heitich Brendler; Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo Augusto da Luz Reis (IEEE Trans. Circuits Syst. I Regul. Pap., 2020)

Sensitivity of FinFET Adders to PVT Variations and Sleep Transistor as a Mitigation Strategy. - Gerson D. Andrade; Ricardo A. L. Reis; Eduardo A. C. da Costa; Alexandra L. Zimpeck (APCCAS, 2021)

Voltage Scaling Influence on the Soft Error Susceptibility of a FinFET-based Circuit. - Leonardo Heitich Brendler; Alexandra L. Zimpeck; Fernanda Lima Kastensmidt; Cristina Meinhardt; Ricardo A. L. Reis (LASCAS, 2021)

Current Behavior on Process Variability Aware FinFET Inverter Designs. - Leonardo B. Moraes; Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo Reis 001 (LASCAS, 2021)

Exploring Gate Mapping and Transistor Sizing to Improve Radiation Robustness: A C17 Benchmark Case-study. - Bernardo Borges Sandoval; Leonardo Heitich Brendler; Alexandra L. Zimpeck; Fernanda Lima Kastensmidt; Ricardo Reis 001; Cristina Meinhardt (LATS, 2021)

Exploring XOR-based Full Adders and decoupling cells to variability mitigation at FinFET technology. - Fábio G. R. G. da Silva; Rafael N. M. Oliveira; Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo Reis 001 (Integr., 2022)

Fast and Low-Error Prediction of Logic Gate Cell Characterization. - Gabriel Lima Jacinto; Cínthia Schneider; Alexandra L. Zimpeck; Mateus Grellert; Cristina Meinhardt (ICECS, 2023)

Impact on Radiation Robustness of Gate Mapping in FinFET Circuits under Work-function Fluctuation. - Bernardo Borges Sandoval; Leonardo Heitich Brendler; Fernanda Lima Kastensmidt; Ricardo Reis 001; Alexandra L. Zimpeck; Rafael B. Schvittz; Cristina Meinhardt (ISCAS, 2023)

A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM Architectures. - Cleiton Magano Marques; Leonardo Heitich Brendler; Frédéric Wrobel; Alexandra L. Zimpeck; Walter E. Calienes Bartra; Paulo F. Butzen; Cristina Meinhardt (SBCCI, 2023)

An Approach to Remote Update Embedded Systems in the Internet of Things. - Cleber S. Peter; Lucas Penning; Alexandra L. Zimpeck; Felipe Marques; Adenauer C. Yamin (J. Internet Serv. Appl., 2023)

Robustness Analysis of 3-2 Adder Compressor Designed in 7-nm FinFET Technology. - Gerson D. Andrade; Matheus Silva; Cínthia Schneider; Guilherme Paim; Sergio Bampi; Eduardo Costa 001; Alexandra L. Zimpeck (IEEE Trans. Circuits Syst. II Express Briefs, 2023)

Guest Editorial Special Issue on the IEEE Latin American Symposium on Circuits and Systems (LASCAS 2023). - Alexandra L. Zimpeck; Alexander Fish (IEEE Trans. Circuits Syst. I Regul. Pap., 2024)