Influence of Threshold Voltage Deviations on 90nm SRAM Core-Cell Behavior. - Magali Bastian; Vincent Gouin; Patrick Girard 001; Christian Landrault; Alexandre Ney; Serge Pravossoudovitch; Arnaud Virazel (ATS, 2007)

Slow write driver faults in 65nm SRAM technology: analysis and March test solution. - Alexandre Ney; Patrick Girard 001; Christian Landrault; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian (DATE, 2007)

Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs. - Alexandre Ney; Patrick Girard 001; Christian Landrault; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian (ETS, 2007)

Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs. - Alexandre Ney; Patrick Girard 001; Christian Landrault; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian (VTS, 2007)

A Design-for-Diagnosis Technique for SRAM Write Drivers. - Alexandre Ney; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian; Vincent Gouin (DATE, 2008)

A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs. - Alexandre Ney; Alberto Bosio; Luigi Dilillo; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian (ITC, 2008)

An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing. - Alexandre Ney; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian; Vincent Gouin (VTS, 2008)

A new design-for-test technique for SRAM core-cell stability faults. - Alexandre Ney; Luigi Dilillo; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian; Vincent Gouin (DATE, 2009)

Analysis of Resistive-Open Defects in SRAM Sense Amplifiers. - Alexandre Ney; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian (IEEE Trans. Very Large Scale Integr. Syst., 2009)