DC and RF Reliability Assessment of 5G-MMW capable GaN HEMT Process (Invited). - Satyaki Ganguly; Kyle M. Bothe; Alexandre Niyonzima; Thomas Smith; Yueying Liu; Jeremy Fisher; Fabian Radulescu; Donald A. Gajewski; Scott T. Sheppard; Jim W. Milligan; Basim Noori; John W. Palmour (IRPS, 2022)