Performance and reliability of strained SOI transistors for advanced planar FDSOI technology. - Guillaume Besnard; Xavier Garros; Alexandre Subirats; François Andrieu; X. Federspiel; M. Rafik; Walter Schwarzenbach; Gilles Reimbold; Olivier Faynot; Sorin Cristoloveanu (IRPS, 2015)

A new method for quickly evaluating reversible and permanent components of the BTI degradation. - Xavier Garros; Alexandre Subirats; Gilles Reimbold; Fred Gaillard; Cheikh Diouf; X. Federspiel; Vincent Huard; M. Rafik (IRPS, 2018)

Characterization and modeling of dynamic variability induced by BTI in nano-scaled transistors. - Xavier Garros; Antoine Laurent; Alexandre Subirats; X. Federspiel; E. Vincent; Gilles Reimbold (Microelectron. Reliab., 2018)

Understanding and Variability of Lateral Charge Migration in 3D CT-NAND Flash with and Without Band-Gap Engineered Barriers. - Andrea Padovani; Milan Pesic; Mondol Anik Kumar; Pieter Blomme; Alexandre Subirats; Senthil Vadakupudhupalayam; Zunaid Baten; Luca Larcher (IRPS, 2019)