Physically-based extraction methodology for accurate MOSFET degradation assessment. - Giulio Torrente; Jean Coignus; Sophie Renard; Alexandre Vernhet; Gilles Reimbold; David Roy 001; Gérard Ghibaudo (Microelectron. Reliab., 2015)

Physically-based evaluation of aging contributions in HC/FN-programmed 40 nm NOR Flash technology. - Giulio Torrente; Jean Coignus; Alexandre Vernhet; Jean-Luc Ogier; David Roy 001; Gérard Ghibaudo (Microelectron. Reliab., 2017)