Exact closed-form expressions for substrate resistance and capacitance extraction in nanoscale VLSI. - Yiorgos I. Bontzios; Michael G. Dimopoulos; Alexandros I. Dimitriadis; Alkis A. Hatzopoulos (Microelectron. J., 2013)

Generalized non-local surface susceptibility model and Fresnel coefficients for the characterization of periodic metafilms with bianisotropic scatterers. - Alexandros I. Dimitriadis; Nikolaos V. Kantartzis; Theodoros D. Tsiboukis; Christian Hafner 001 (J. Comput. Phys., 2015)

Polymer-Based Additive Manufacturing of High-Performance Waveguide and Antenna Components. - Alexandros I. Dimitriadis; Tomislav Debogovic; Mirko Favre; Mathieu Billod; Luca Barloggio; Jean-Philippe Ansermet; Emile de Rijk (Proc. IEEE, 2017)

Improvements to Millimeter-Wave Dielectric Measurement Using Material Characterization Kit (MCK). - Minjie Shu; Xiaobang Shang; Nick M. Ridler; Antoine R. Calleau; Alexandros I. Dimitriadis; Anxue Zhang (IEEE Trans. Instrum. Meas., 2024)