Characterization of Thermal Runaway in a Ge Photodiode for Si Photonics. - Stewart E. Rauch; Dongho Lee; Alexey Vert; Roy Gupta (NATW, 2020)

Reliability Failure Modes of an Integrated Ge Photodiode for Si Photonics. - Stewart E. Rauch; Dongho Lee; Alexey Vert; Lin Jiang; Byoung Min (OFC, 2020)