Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs. - Carlos J. González; Bruno L. Costa; Diego N. Machado; Rafael Galhardo Vaz; Alexis C. Vilas Bôas; Odair Lelis Gonçalez; Helmut Puchner; Fernanda Lima Kastensmidt; Nilberto H. Medina; Marcilei Aparecida Guazzelli; Tiago Roberto Balen (J. Electron. Test., 2021)

Exploring Fault Tolerance to Ionizing Radiation in Severe Environments: Power Transistors with Distinct Layouts. - Paulo R. Garcia; Guilherme I Grandesi; Alexis C. Vilas Bôas; Renato C. Giacomini; Nilberto H. Medina; Luis Eduardo Seixas Jr.; Marcilei Aparecida Guazzelli (LASCAS, 2025)

On the Vulnerability of UMOSFETs in Terrestrial Radiation Environments. - Saulo G. Alberton; Alexis C. Vilas Bôas; Jeffery Wyss; Vitor A. P. Aguiar; Matheus S. Pereira; Luca Silvestrin; Serena Mattiazzo; Alessandro Paccagnella; Carlo Cazzaniga; Maria Kastriotou; Christopher D. Frost; Nilberto H. Medina (IEEE Access, 2025)