Dispatching of lots to dynamically reduce the wafers at risk in semiconductor manufacturing. - Gloria Rodríguez-Verján; Eric Tartiere; Jacques Pinaton; Stéphane Dauzère-Pérès; Alexis Thieullen (CASE, 2012)

Application of Principal Components Analysis to improve fault detection and diagnosis on semiconductor manufacturing equipment. - Alexis Thieullen; Mustapha Ouladsine; Jacques Pinaton (ECC, 2013)