Determination of the power losses due to the nonlinear coss capacitance of SJ MOSFETs submitted to voltage transients in ZVS applications. - Angelo Chiarenza; Angelo Raciti; Rosario Scollo; Alfio Scuto (IECON, 2017)

Modeling of the Power Losses due to Coss in SJ MOSFETs Submitted to ZVS: Identification of the Passive Parameters by a Genetic Algorithm. - Angelo Raciti; Santi Agatino Rizzo; Nunzio Salerno; Giovanni Susinni; Rosario Scollo; Alfio Scuto; Salvatore Musumeci; Eric Armando (IECON, 2018)

Understanding the Kelvin pin mitigation of the MOSFET turn-on losses by fast-switching and neutralization of the clamp diode. - Francesco Giorgio; Santi Agatino Rizzo; Nunzio Salerno; Giuseppe Scarcella; Alfio Scuto; Giuseppe Sorrentino (IECON, 2021)