Prototype Testing Simplified by Scannable Buffers and Latches. - Andy Halliday; Greg Young; Alfred L. Crouch (ITC, 1989)

Testabilty Features of the MC 68060 Microprocessor. - Alfred L. Crouch; Matthew Pressly; Joe Circello (ITC, 1994)

Low-Power Mode and IEEE 1149.1 Compliance - A Low-Power Solution. - Alfred L. Crouch; Rick Ramus; Colin M. Maunder (ITC, 1994)

The superscalar architecture of the MC68060. - Joe Circello; Greg Edgington; Dan McCarthy; James Gay; David Schimke; Steven Sullivan; Richard Duerden; Chris Hinds; Danny Marquette; Lal Sood; Al Crouch; Daniel Chow (IEEE Micro, 1995)

A Case Study of the Test Development for the 2nd Generation ColdFire® Microprocessors. - Michael Mateja; Alfred L. Crouch; Renny Eisele; Grady Giles; Dale Amason (ITC, 1997)

Designing and Verifying Embedded Microprocessors. - Al Crouch; Jeff Freeman (IEEE Des. Test Comput., 1997)

Best Methods for At-Speed Testing? - Peter C. Maxwell; Steve Baird; Wayne M. Needham; Al Crouch; Phil Nigh (VTS, 1998)

Test Development for Second-Generation ColdFire Microprocessors. - Dale Amason; Alfred L. Crouch; Renny Eisele; Grady Giles; Michael Mateja (IEEE Des. Test Comput., 1998)

The testability features of the 3rd generation ColdFire family of microprocessors. - Alfred L. Crouch; Michael Mateja; Teresa L. McLaurin; John C. Potter; Dat Tran (ITC, 1999)

The DFT Psychic Network. - Al Crouch (IEEE Des. Test Comput., 1999)

Optimization trade-offs for vector volume and test power. - Bahram Pouya; Alfred L. Crouch (ITC, 2000)

Test Development for a Third-Version ColdFire Microprocessor. - Alfred L. Crouch; Michael Mateja; Teresa L. McLaurin; John C. Potter; Dat Tran (IEEE Des. Test Comput., 2000)

Very Low Cost Testers: Opportunities and Challenges. - Jay Bedsole; Rajesh Raina; Al Crouch; Magdy S. Abadir (IEEE Des. Test Comput., 2001)

Testing the Tester: What Broke? Where? When? Why? - Alfred L. Crouch (ITC, 2002)

AC Scan Path Selection for Physical Debugging. - Alfred L. Crouch; John C. Potter; Jason Doege (IEEE Des. Test Comput., 2003)

Future Trends in Test: The Adoption and Use of Low Cost Structural Testers. - Alfred L. Crouch (ITC, 2004)

IJTAG (internal JTAG): a step toward a DFT standard. - Jeff Rearick; Bill Eklow; Ken Posse; Al Crouch; Ben Bennetts (ITC, 2005)

Characterize Predicted vs Actual IR Drop in a Chip Using Scan Clocks. - Zahi S. Abuhamdeh; Philip Pears; Jeff Remmers; Alfred L. Crouch; Bob Hannagan (ITC, 2006)

IEEE P1687: Toward Standardized Access of Embedded Instrumentation. - Ken Posse; Al Crouch; Jeff Rearick; Bill Eklow; Mike Laisne; Ben Bennetts; Jason Doege; Mike Ricchetti; Jean-Francois Cote (ITC, 2006)

Processing High Volume Scan Test Results for Yield Learning. - Alfred L. Crouch; Phil Burlison; Dennis J. Ciplickas (ISQED, 2007)

Separating temperature effects from ring-oscillator readings to measure true IR-drop on a chip. - Zahi S. Abuhamdeh; Vincent D'Alassandro; Richard Pico; Dale Montrone; Alfred L. Crouch; Andrew Tracy (ITC, 2007)

IJTAG: The path to organized instrument connectivity. - Alfred L. Crouch (ITC, 2007)

A Production IR-Drop Screen on a Chip. - Zahi S. Abuhamdeh; Bob Hannagan; Jeff Remmers; Alfred L. Crouch (IEEE Des. Test Comput., 2007)

The Advantages of Limiting P1687 to a Restricted Subset. - Jason Doege; Alfred L. Crouch (ITC, 2008)

IEEE P1687 IJTAG a presentation of current technology. - Ken Posse; Al Crouch; Jeff Rearick (ITC, 2009)

We need more standards like IEEE 1500. - Miron Abramovici; Al Crouch (IEEE Des. Test Comput., 2009)

Board assisted-BIST: Long and short term solutions for testpoint erosion - Reaching into the DFx toolbox. - Zoe Conroy; James J. Grealish; Harrison Miles; Anthony J. Suto; Alfred L. Crouch; Skip Meyers (ITC, 2012)

BA-BIST: Board test from inside the IC out. - Zoe Conroy; Alfred L. Crouch (ITC, 2013)

Don't forget to lock your SIB: Hiding instruments using P16871. - Jennifer Dworak; Al Crouch; John C. Potter; Adam Zygmontowicz; Micah Thornton (ITC, 2013)

FPGA-Based Embedded Tester with a P1687 Command, Control, and Observe-System. - Alfred L. Crouch; John C. Potter; Ajay Khoche; Jennifer Dworak (IEEE Des. Test, 2013)

Making it harder to unlock an LSIB: Honeytraps and misdirection in a P1687 network. - Adam Zygmontowicz; Jennifer Dworak; Al Crouch; John C. Potter (DATE, 2014)

Board security enhancement using new locking SIB-based architectures. - Jennifer Dworak; Zoe Conroy; Alfred L. Crouch; John C. Potter (ITC, 2014)

A call to action: Securing IEEE 1687 and the need for an IEEE test Security Standard. - Jennifer Dworak; Al Crouch (VTS, 2015)

Invited - A box of dots: using scan-based path delay test for timing verification. - Alfred L. Crouch; John C. Potter (DAC, 2016)

Using Existing Reconfigurable Logic in 3D Die Stacks for Test. - Fanchen Zhang; Yi Sun; Xi Shen; Kundan Nepal; Jennifer Dworak; Theodore W. Manikas; Ping Gui; R. Iris Bahar; Al Crouch; John C. Potter (NATW, 2016)

Increasing IJTAG bandwidth and managing security through parallel locking-SIBs. - Saurabh Gupta 005; Al Crouch; Jennifer Dworak; Daniel Engels (ITC, 2017)

Detecting a trojan die in 3D stacked integrated circuits. - Soha Alhelaly; Jennifer Dworak; Theodore W. Manikas; Ping Gui; Kundan Nepal; Alfred L. Crouch (NATW, 2017)

Mitigating simple power analysis attacks on LSIB key logic. - Saurabh Gupta 005; Jennifer Dworak; Daniel Engels; Al Crouch (NATW, 2017)

Generalizing Access to Instrumentation Embedded in a Semiconductor Device. - Al Crouch; Michael Laisne; Martin Keim (Computer, 2017)

Innovative practices on machine learning for emerging applications. - Kareem Madkour; Zhaobo Zhang; Alfred L. Crouch; Peter L. Levin; Eve Hunter; Yu Huang 005 (VTS, 2018)

Innovate Practices on CyberSecurity of Hardware Semiconductor Devices. - Alfred L. Crouch; Peter L. Levin; Jennifer Dworak; Lakshmi Ramakrishnan; Yuhe Xia; Chi Zhang; Daniel Engels; Gary Evans; Ping Gui; Scott McWilliams; Saurabh Gupta 005; Franco Stellari; et al. (VTS, 2019)

Innovative Practices on IEEE 1687.xyz. - Jeff Rearick; Alfred L. Crouch; Hans Martin von Staudt (VTS, 2019)

Modeling Novel Non-JTAG IEEE 1687-Like Architectures. - Mike Laisne; Alfred L. Crouch; Michele Portolan; Martin Keim; Hans Martin von Staudt; M. Abdalwahab; Bradford G. Van Treuren; Jeff Rearick (ITC, 2020)

A role for embedded instrumentation in real-time hardware assurance and online monitoring against cybersecurity threats. - Alfred L. Crouch; Adam W. Ley (IEEE Instrum. Meas. Mag., 2020)

3D Ring Oscillator Based Test Structures to Detect a Trojan Die in a 3D Die Stack in the Presence of Process Variations. - Soha Alhelaly; Jennifer Dworak; Kundan Nepal; Theodore W. Manikas; Ping Gui; Alfred L. Crouch (IEEE Trans. Emerg. Top. Comput., 2021)

IEEE P1687.1: Extending the Network Boundaries for Test. - Michael Laisne; Alfred L. Crouch; Michele Portolan; Martin Keim; Hans Martin von Staudt; Bradford G. Van Treuren; Jeff Rearick; Songlin Zuo (ITC, 2022)