Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis. - Ramakrishna Voorakaranam; Sudip Chakrabarti; Junwei Hou; Alfred V. Gomes; Sasikumar Cherubal; Abhijit Chatterjee; William H. Kao (ITC, 1997)

Modular Fault Simulation of Mixed Signal Circuits with Fault Ranking by Severity. - Alfred V. Gomes; Ramakrishna Voorakaranam; Abhijit Chatterjee (DFT, 1998)

Minimal Length Diagnostic Tests for Analog Circuits using Test History. - Alfred V. Gomes; Abhijit Chatterjee (DATE, 1999)

Robust optimization based backtrace method for analog circuits. - Alfred V. Gomes; Abhijit Chatterjee (ICCAD, 1999)

Distance Constrained Dimensionality Reduction for Parametric Fault Test Generator. - Alfred V. Gomes; Abhijit Chatterjee (Asian Test Symposium, 2001)

Alternate Test Generation for Detection of Parametric Faults. - Alfred V. Gomes (2003)

Low Cost Dynamic Test Methodology for High Precision ΣD ADCs. - Sehun Kook; Hyun Woo Choi; Vishwanath Natarajan; Abhijit Chatterjee; Alfred V. Gomes; Shalabh Goyal; Le Jin (Asian Test Symposium, 2009)

Signal Acquisition of High-Speed Periodic Signals Using Incoherent Sub-Sampling and Back-End Signal Reconstruction Algorithms. - Hyun Woo Choi; Alfred V. Gomes; Abhijit Chatterjee (IEEE Trans. Very Large Scale Integr. Syst., 2011)