Logic Gate Failure Characterization for Nanoelectronic EDA Tools. - Payman Zarkesh-Ha; Ali Arabi M. Shahi (DFT, 2010)

Prediction of gate delay variation for CNFET under CNT density variation. - Ali Arabi M. Shahi; Payman Zarkesh-Ha (DFT, 2012)

Comparison of variations in MOSFET versus CNFET in gigascale integrated systems. - Ali Arabi M. Shahi; Payman Zarkesh-Ha; Mirza Elahi (ISQED, 2012)