Methodology of semiconductor devices classification into groups of differentiated quality. - Alicja Konczakowska (Microelectron. Reliab., 2008)

A New Method for RTS Noise of Semiconductor Devices Identification. - Alicja Konczakowska; Jacek Cichosz; Arkadiusz Szewczyk (IEEE Trans. Instrum. Meas., 2008)

Classification of high-voltage varistors into groups of differentiated quality. - Lech Hasse; Alicja Konczakowska; Janusz M. Smulko (Microelectron. Reliab., 2009)