Automated Optical Inspection Using Anomaly Detection and Unsupervised Defect Clustering. - Jan Lehr; Alik Sargsyan; Martin Pape; Jan Philipps; Jörg Krüger (ETFA, 2020)

AD3: Introducing a Score for Anomaly Detection Dataset Difficulty Assessment Using VIADUCT Dataset. - Jan Lehr; Jan Philipps; Alik Sargsyan; Martin Pape; Jörg Krüger (ECCV (68), 2024)