An Analysis of Fault Effects and Propagations in AVR Microcontroller ATmega103(L). - Alireza Rohani; Hamid R. Zarandi (ARES, 2009)

A New CLB Architecture for Tolerating SEU in SRAM-Based FPGAs. - Alireza Rohani; Hamid R. Zarandi (ReConFig, 2009)

Two effective methods to mitigate soft error effects in SRAM-based FPGAs. - Alireza Rohani; Hamid R. Zarandi (Microelectron. Reliab., 2010)

A Technique for Accelerating Injection of Transient Faults in Complex SoCs. - Alireza Rohani; Hans G. Kerkhoff (DSD, 2011)

Study of the effects of SET induced faults on submicron technologies. - Alireza Rohani; Hans G. Kerkhoff (DSN Workshops, 2011)

An on-line soft error mitigation technique for control logic of VLIW processors. - Alireza Rohani; Hans G. Kerkhoff (DFT, 2012)

Pulse-length determination techniques in the rectangular single event transient fault model. - Alireza Rohani; Hans G. Kerkhoff; Enrico Costenaro; Dan Alexandrescu (ICSAMOS, 2013)

Rapid transient fault insertion in large digital systems. - Alireza Rohani; Hans G. Kerkhoff (Microprocess. Microsystems, 2013)

Two soft-error mitigation techniques for functional units of DSP processors. - Alireza Rohani; Hans G. Kerkhoff (ETS, 2014)

On the maximization of the sustained switching activity in a processor. - Riccardo Cantoro; Matteo Sonza Reorda; Alireza Rohani; Hans G. Kerkhoff (IOLTS, 2015)

Detecting intermittent resistive faults in digital CMOS circuits. - Hassan Ebrahimi; Alireza Rohani; Hans G. Kerkhoff (DFT, 2016)

A software framework to calculate local temperatures in CMOS processors. - Alireza Rohani; Hassan Ebrahimi; Hans G. Kerkhoff (PATMOS, 2016)

Thermal issues in test: An overview of the significant aspects and industrial practice. - Juergen Alt; Paolo Bernardi; Alberto Bosio; Riccardo Cantoro; Hans G. Kerkhoff; Andreas Leininger; Wolfgang Molzer; Alessandro Motta; Christian Pacha; Alberto Pagani; Alireza Rohani; R. Strasser (VTS, 2016)