The Effects of Carbon Doping on the Performance and Electrical Reliability of SiGe HBTs. - Harrison P. Lee; Nelson Sepúlveda-Ramos; Jeffrey W. Teng; Jackson P. Moody; Delgermaa Nergui; Brett L. Ringel; Zachary R. Brumbach; Alizeh Premani; Uppili S. Raghunathan; Vibhor Jain; John D. Cressler (BCICTS, 2023)