Realizing a High Measure of Confidence for Defect Level Analysis of Random Testing. - Paresh Gondalia; Allan Gutjahr; Wen-Ben Jone (ITC, 1993)

Realizing a high measure of confidence for defect level analysis of random testing [VLSI]. - Wen-Ben Jone; Paresh Gondalia; Allan Gutjahr (IEEE Trans. Very Large Scale Integr. Syst., 1995)