Failure Mechanism and Unified Endurance Model of Embedded MRAM Towards Cache Application. - Y. H. Chen; Yu-Sheng Chen; Yi Ching Ong; Y. L. Chu; Kuo-Feng Huang; Yuan-Jen Lee; C. Y. Wang; C. Y. Wu; W. H. Chuang; Allen Y. J. Wang; K. C. Huang; Harry Chuang (IRPS, 2025)

Design-Technology-Reliability Co-Optimization for MRAM-OTP Integration - A Methodological Approach. - Y. C. Ong; Y. H. Chen; H. H. Wang; J. Q. Liang; Y. S. Chen; Jarcle Huang; T. W. Chiang; J. C. Huang; C. H. Weng; C. Y. Wang; Bruce P. H. Lee; Allen Y. J. Wang; et al. (IRPS, 2025)