Carafe: an inductive fault analysis tool for CMOS VLSI circuits. - Alvin Jee; F. Joel Ferguson (VTS, 1993)

A methodolgy for characterizing cell testability. - Alvin Jee; F. Joel Ferguson (VTS, 1997)

Optimizing Memory Tests by Analyzing Defect Coverage. - Alvin Jee; Jonathon E. Colburn; V. Swamy Irrinki; Mukesh Puri (MTDT, 2000)

Using Electrical Bitmap Results from Embedded Memory to Enhance Yield. - Julie Segal; Alvin Jee; David Y. Lepejian; Ben Chu (IEEE Des. Test Comput., 2001)

An Integrated Approach to Yield Loss Characterization. - Mark Craig; Alvin Jee; Prashant Maniar (ITC, 2002)

Defect-Oriented Analysis of Memory BIST Tests. - Alvin Jee (MTDT, 2002)