Static Verification of Test Vectors for IR Drop Failure. - Aman Kokrady; C. P. Ravikumar (ICCAD, 2003)

Fast, Layout-Aware Validation of Test-Vectors for Nanometer-Related Timing Failures. - Aman Kokrady; C. P. Ravikumar (VLSI Design, 2004)

Reducing Design Verification Cycle Time through Testbench Redundancy. - Aman Kokrady; Theo J. Powell; S. Ramakrishnan (VLSI Design, 2006)

The Importance of Functional-Like Access for Memory Test. - Jonathan Phelps; Chuck Johnson; Corey Goodrich; Aman Kokrady (ITC, 2008)

Memory Yield Improvement through Multiple Test Sequences and Application-Aware Fault Models. - Aman Kokrady; C. P. Ravikumar; Nitin Chandrachoodan (VLSI Design, 2008)