Functional testing and fault analysis based fault coverage enhancement techniques for embedded core based systems. - Ameet Bagwe; Rubin A. Parekhji (Asian Test Symposium, 2000)

A framework to evaluate test tradeoffs in embedded core based systems-case study on TI's TMS320C27xx. - Jais Abraham; Narayan Prasad; Srinivasa Chakravarthy B. S.; Ameet Bagwe; Rubin A. Parekhji (ITC, 2000)