Modeling Dark Current Degradation of Monolithic InGaAs/GaAs-On-Si Nano-Ridge Photodetectors. - Ping-Yi Hsieh; Ameni Ben Driss; Artemisia Tsiara; Barry J. O'Sullivan; Didit Yudistira; Bernardette Kunert; Joris Van Campenhout; Ingrid De Wolf (IRPS, 2024)