Evaluation of Vce Monitoring as a Real-Time Method to Estimate Aging of Bond Wire-IGBT Modules Stressed by Power Cycling. - Vanessa Smet; François Forest; Jean-Jacques Huselstein; Amgad Rashed; Frédéric Richardeau (IEEE Trans. Ind. Electron., 2013)

Fast power cycling protocols implemented in an automated test bench dedicated to IGBT module ageing. - François Forest; Amgad Rashed; Jean-Jacques Huselstein; Thierry Martiré; Philippe Enrici (Microelectron. Reliab., 2015)