Built-In-Self-Testing Techniques for Programmable Capacitor Arrays. - Amit Laknaur; Haibo Wang 005 (ISQED, 2005)

A methodology to perform online self-testing for field-programmable analog array circuits. - Amit Laknaur; Haibo Wang 005 (IEEE Trans. Instrum. Meas., 2005)

Design ofWindow Comparators for Integrator-Based Capacitor Array Testing Circuits. - Amit Laknaur; Haibo Wang 005 (ISQED, 2006)

Investigating the Efficiency of Integrator-Based Capacitor Array Testing Techniques. - Sai Raghuram Durbha; Amit Laknaur; Haibo Wang 005 (VTS, 2006)

Built-In-Self-Testing Techniques for Programmable Capacitor Arrays. - Amit Laknaur; Sai Raghuram Durbha; Haibo Wang 005 (J. Electron. Test., 2006)

A Fully Programmable Analog Window Comparator. - Rui Xiao; Amit Laknaur; Haibo Wang 005 (ISCAS, 2007)

A Programmable Window Comparator for Analog Online Testing. - Amit Laknaur; Rui Xiao; Haibo Wang 005 (VTS, 2007)

Design of a window comparator with adaptive error threshold for online testing applications. - Amit Laknaur; Rui Xiao; Sai Raghuram Durbha; Haibo Wang 005 (Microelectron. J., 2009)

Test method and scheme for low-power validation in modern SOC integrated circuits. - Bonita Bhaskaran; Amit Sanghani; Kaushik Narayanun; Ayub Abdollahian; Amit Laknaur (VTS, 2016)