Modified Scan Flip-Flop for Low Power Testing. - Amit Mishra 002; Nidhi Sinha; Satdev; Virendra Singh; Sreejit Chakravarty; Adit D. Singh (Asian Test Symposium, 2010)

Operand Isolation with Reduced Overhead for Low Power Datapath Design. - Lokesh Siddhu; Amit Mishra 002; Virendra Singh (VLSID, 2014)