Novel Heuristic and Genetic Algorithms for the VLSI Test Coverage Problem. - Walid Ibrahim; Amr El-Chouemi; Hesham El-Sayed (AICCSA, 2006)

A Two-Phase Genetic Algorithm for VLSI Test vector Selection. - Walid Ibrahim; Amr El-Chouemi; Hoda H. Amer (IEEE Congress on Evolutionary Computation, 2006)

An adaptive heuristic algorithm for VLSI test vectors selection. - Walid Ibrahim; Hesham El-Sayed; Amr El-Chouemi; Hoda H. Amer (Eur. J. Oper. Res., 2009)