8-Bit Multiplier Simulation Experiments Investigating the Use of Power Supply Transient Signals for the Detection of CMOS Defects. - James F. Plusquellic; Amy Germida; Zheng Yan (DFT, 1999)

Defect detection using power supply transient signal analysis. - Amy Germida; Zheng Yan; James F. Plusquellic; Fidel Muradali (ITC, 1999)

Predicting device performance from pass/fail transient signal analysis data. - James F. Plusquellic; Amy Germida; Jonathan Hudson; Ernesto Staroswiecki; Chintan Patel (ITC, 2000)

Detection of CMOS Defects under Variable Processing Conditions. - Amy Germida; James F. Plusquellic (VTS, 2000)