A Cascade Open-Short-Thru (COST) De-Embedding Method for Microwave On-Wafer Characterization and Automatic Measurement. - Ming-Hsiang Cho; Guo-Wei Huang; Chia-Sung Chiu; Kun-Ming Chen; An-Sam Peng; Yu-Min Teng (IEICE Trans. Electron., 2005)

Through-Silicon-Via Characterization and Modeling Using a Novel One-Port De-Embedding Technique. - An-Sam Peng; Ming-Hsiang Cho; Yueh-Hua Wang; Meng-Fang Wang; David Chen; Lin-Kun Wu (IEICE Trans. Electron., 2013)

An Improved EEHEMT RF Noise Model for 0.25 µm InGaP pHEMT Transistor Using Verilog-A Language. - An-Sam Peng; Lin-Kun Wu (IEICE Trans. Electron., 2017)