Defect classification in shearography images using convolutional neural networks. - Herberth Birck Fröhlich; Analucia Vieira Fantin; Bernardo Cassimiro Fonseca de Oliveira; Daniel Pedro Willemann; Lucas Arrigoni Iervolino; Mauro Eduardo Benedet; Armando Albertazzi Gonçalves Júnior (IJCNN, 2018)

Noise Analysis Directly on Shearography Wrapped Phase Maps. - Diego Staub; Analucia Vieira Fantin; Daniel Pedro Willemann; Mauro Eduardo Benedet; Thiago Destri Cabral; Ana Lúcia F. S. d'Almeida; Armando Albertazzi Gonçalves Júnior (IEEE Trans. Instrum. Meas., 2024)