Impact of Negative Bias Temperature Instability on Product Parametric Drift. - Vijay Reddy; John M. Carulli; Anand T. Krishnan; William Bosch; Brendan Burgess (ITC, 2004)

Impact of negative bias temperature instability on digital circuit reliability. - Vijay Reddy; Anand T. Krishnan; Andrew Marshall; John Rodriguez; Sreedhar Natarajan; Tim Rost; Srikanth Krishnan (Microelectron. Reliab., 2005)

An Integrated Modeling Paradigm of Circuit Reliability for 65nm CMOS Technology. - Wenping Wang 004; Vijay Reddy; Anand T. Krishnan; Rakesh Vattikonda; Srikanth Krishnan; Yu Cao 001 (CICC, 2007)