Design and Performance Analysis of SiGe Hetero Nanotube Junctionless FET. - Anchal Thakur; Rohit Dhiman (TENCON, 2019)

A physics-based drain current model for Si1-xGex source/drain NT JLFET for enhanced hot carrier reliability with temperature measurement. - Anchal Thakur; Rohit Dhiman (Microelectron. J., 2022)