Machine Learning Applied to the Classification of Technical Inspection Recommendations Regarding the Trend to Increase Criticality. - André Amaral; André L. R. de Araújo; Bruno Tomazela; Tatiana Escovedo; Marcos Kalinowski (SBSI, 2023)

An ANN-Based Approach to the Modelling and Simulation of Analogue Circuits. - André Amaral; António Gusmão 001; Rafael Vieira; Ricardo Martins 003; Nuno Horta; Nuno Lourenço 003 (SMACD, 2023)