Fast Antirandom (FAR) Test Generation. - Anneliese von Mayrhauser; Andre Bai; Tom Chen 001; Charles Anderson 001; Amjad Hajjar (HASE, 1998)

Fast Anti-Random (FAR) Test Generation to Improve the Quality of Behavioral Model Verification. - Tom Chen 001; Andre Bai; Amjad Hajjar; Anneliese Amschler Andrews; Charles Anderson 001 (J. Electron. Test., 2002)