Using the EM simulation tools to predict the Conducted Emissions level of a DC/DC boost converter: Introducing EBEM-CE model. - André Durier; Christian Marot; Olivier Crépel (EMC Compo, 2013)

Translation of automotive module RF immunity test limits into equivalent IC test limits using S-parameter IC models. - Hugo Pues; Ben Brike; Celina Gazda; Peter Teichmann; Kristof Stijnen; Christian Peeters; André Durier; Dries Vande Ginste (EMC Compo, 2013)

A methodologic project to characterize and model COTS component reliability. - André Durier; Alain Bensoussan 002; Moustafa Zerarka; Chaimae Ghfiri; Alexandre Boyer; Hélène Frémont (Microelectron. Reliab., 2015)

Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach. - S. Hairoud-Airieau; Geneviève Duchamp; Tristan Dubois; Jean-Yves Delétage; André Durier; Hélène Frémont (Microelectron. Reliab., 2017)

Temperature and voltage effects on HTRB and HTGB stresses for AlGaN/GaN HEMTs. - Omar Chihani; Loic Théolier; Jean-Yves Delétage; Eric Woirgard; Alain Bensoussan 002; André Durier (IRPS, 2018)

Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stresses. - Omar Chihani; L. Théolier; Alain Bensoussan 002; Jean-Yves Delétage; André Durier; Eric Woirgard (Microelectron. Reliab., 2018)