Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs. - Cora Salm; André J. Hof; Fred G. Kuper; Jurriaan Schmitz (Microelectron. Reliab., 2006)

Low-frequency noise in hot-carrier degraded nMOSFETs. - Cora Salm; Eric Hoekstra; Jay S. Kolhatkar; André J. Hof; Hans Wallinga; Jurriaan Schmitz (Microelectron. Reliab., 2007)