Device level maverick screening: detection of risk devices through independent component analysis. - Anja Zernig; Olivia Bluder; Jürgen Pilz; Andre Kästner (WSC, 2014)

Markov random fields for pattern extraction in analog wafer test data. - Stefan Schrunner; Olivia Bluder; Anja Zernig; Andre Kästner; Roman Kern (IPTA, 2017)

A Comparison of Supervised Approaches for Process Pattern Recognition in Analog Semiconductor Wafer Test Data. - Stefan Schrunner; Olivia Bluder; Anja Zernig; Andre Kästner; Roman Kern (ICMLA, 2018)

A Health Factor for Process Patterns Enhancing Semiconductor Manufacturing by Pattern Recognition in Analog Wafermaps. - Stefan Schrunner; Anna Jenul; Michael Scheiber; Anja Zernig; Andre Kästner; Roman Kern (SMC, 2019)

Machine Learning based Indicators to Enhance Process Monitoring by Pattern Recognition. - Stefan Schrunner; Michael Scheiber; Anna Jenul; Anja Zernig; Andre Kästner; Roman Kern (CoRR, 2021)

Improving wafer map classification in Industry 4.0. - Michael Scheiber; Clement Nartey; Anja Zernig; Andre Kästner (ICPS, 2022)